Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends
Inhalt Karte:
CHEMICAL ANALYSIS ; VOL. 86 547,227 BENNINGHOVEN A., RÜDENAUER F.G., WERNER H.W. Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends / A. Benninghoven, F.G. Rudenauer, H.W. Werner. - New York [etc.] : John Wiley and Sons., Inc., [1987]. - XXXV, 1227 s. : il., wykr. ; 24 cm (Chemical Analysis ; Vol. 86) ISBN 0-471-01056-1
Card-Daten
Kennwort:
CHEMICAL ANALYSIS; VOL. 86
Autoren:
BENNINGHOVEN A., RÜDENAUER F.G.,WERNER H.W.
Unterschrift:
547,227
ISBN:
Jahr:
1987
