Trace analysis of thick samples by proton -induced X-ray emission.
Card's contents:
194,864 AHLBERG MATS Trace analysis of thick samples by proton -induced X-ray emission. Lund 1975 Tryckbaren 4° s. XVII, nlb. 1, 86 il. + wkł. s. nlb. 2. Akademisk avhandling
Card's Details
Keyword:
AHLBERG MATS
Author:
AHLBERG MATS
Signature:
194,864
Year:
1975
