Trace analysis of thick samples by proton -induced X-ray emission
Treść karty:
194,864 AHLBERG MATS Trace analysis of thick samples by proton -induced X-ray emission. Lund 1975 Tryckbaren 40 s. XVII, nlb. 1, 86, il. + wkł. s. nlb. 2. Akademisk avhandling
Dane karty
Hasło:
AHLBERG MATS
Autor:
AHLBERG MATS
Sygnatura:
194,864
Rok wydania:
1975
